Detecting/ measuring microscopic defects, that block electrical flow in semiconductors, with 1,000 times higher resolution

https://techxplore.com/news/2026-01-hidden-defects-degrade-semiconductor-1000x.html

"Hall measurements using electric/ magnetic fields to track electron motion, improved upon by adding controlled light illumination/ temperature variation... under weak light traps begin electron capture, traps fill up as light intensity increases allowing subsequent electrons to move freely... observing transition enables hidden defects' density/ behavior calculation... simultaneously measures electron speed/ lifespan... analyzed both silicon/ perovskite solar cells, identifying performance degradation source... memory chips"