Focused ion beam technology: A single tool for a wide range of applications

https://phys.org/news/2024-01-focused-ion-technology-tool-wide.html

"2 to 30 keV... ion beam scans sample and changes surface with nm precision. FIB instruments universal tool for analysis, maskless local material modification and rapid prototyping of microelectronic components.... use in semiconductors to correct photomasks with focused gallium (or other) ions... analyze and image micro-organisms and viruses... FIB instruments constantly evolving towards other energies, heavier ions... spatially resolved generation of single atomic defects, quantum and information technology"

Related: Quantum magnetometers detect smallest material defects at an early stage
https://phys.org/news/2024-01-quantum-magnetometers-smallest-material-defects.html