Rice University method identifies hidden defects in a 2D hexagonal boron nitride insulator widely used in transistors/ quantum devices

https://www.eurekalert.org/news-releases/1117992

"invisible defects can cause stacking faults/ misalignments acting as charge traps weakening insulation, causing devices to leak electricity/ fail at lower voltages (faults form more readily in thicker flakes)... made visible using cathodoluminescence spectroscopy where electron beam makes material emit light, revealing hidden faults as bright, narrow lines in deep UV spectrum to better: predict device reliability/ spot these defects before they undermine device... ultrathin heterostructure electronics"