P-type vs n-type poly-Si/SiOx passivating contacts

https://www.pv-magazine.com/2022/03/04/p-type-vs-n-type-poly-si-siox-passivating-contacts/

"The research group used secondary ion mass spectrometry (SIMS) and Fourier-transform infrared spectroscopy (FTIR) to investigate the root causes for the different firing behavior in samples passivated by p- and n-type poly-Si with similar passivation quality and crystal properties. The firing treatment was performed through rapid thermal annealing (RTA) furnace and the samples were sandwiched between two 180-μm thick dummy wafers"

Related: Chip-scale spectrometry using a photonic molecule

https://phys.org/news/2023-03-chip-scale-spectrometry-photonic-molecule.html